n this work we present a detailed investigation of native point defects energetics in cubic SiG, using state-of-the-art first principles computational method. We find that, the carbon vacancy is the dominant defect in p-type SiC, regardless the growth conditions. Silicon and carbon antisites are the most common defects in n-type material in Si-rich and C-rich conditions respectively. Interstitial defects and silicon vacancy are less favorite from the energetic point of view. The silicon vacancy tends to transform into a carbon vacancy-antisite complex and the carbon interstitial atom prefers to pair to a carbon antisite. The dumbbell structure is the lowest-energy coufiguration for the isolated carbon interstitial defect, and the tetrahedral interstitial silicon is a stable structure in p-type and intrinsic conditions, while in n-type material the dumbbell configuration is the stable one. Our results suggest that, in samples grown in Si-rich stoichiometric conditions, native defects are a source of n-doping and of compositional unbalance of nominally intrinsic SiC. in accord with experimental evidence.

Energetics of native point defects in cubic silicon carbide

Bernardini F;Mattoni A;Colombo L
2004

Abstract

n this work we present a detailed investigation of native point defects energetics in cubic SiG, using state-of-the-art first principles computational method. We find that, the carbon vacancy is the dominant defect in p-type SiC, regardless the growth conditions. Silicon and carbon antisites are the most common defects in n-type material in Si-rich and C-rich conditions respectively. Interstitial defects and silicon vacancy are less favorite from the energetic point of view. The silicon vacancy tends to transform into a carbon vacancy-antisite complex and the carbon interstitial atom prefers to pair to a carbon antisite. The dumbbell structure is the lowest-energy coufiguration for the isolated carbon interstitial defect, and the tetrahedral interstitial silicon is a stable structure in p-type and intrinsic conditions, while in n-type material the dumbbell configuration is the stable one. Our results suggest that, in samples grown in Si-rich stoichiometric conditions, native defects are a source of n-doping and of compositional unbalance of nominally intrinsic SiC. in accord with experimental evidence.
2004
silicon carbide
semiconductors
point defects
doping
DFT
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/3047
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact