Future large X-ray observatories like ATHENA will be equipped with very large optics, obtained by assembling modular optical elements, named X-ray Optical Units (XOU) based on the technology of either Silicon Pore Optics or Slumped Glass Optics. In both cases, the final quality of the modular optic (a 5 arcsec HEW requirement for ATHENA) is determined by the accuracy alignment of the XOUs within the assembly, but also by the angular resolution of the individual XOU. This is affected by the mirror shape accuracy, its surface roughness, and the mutual alignment of the mirrors within the XOU itself. Because of the large number of XOUs to be produced, quality tests need to be routinely done to select the most performing stacked blocks, to be integrated into the final optic. In addition to the usual metrology based on profile and roughness measurements, a direct measurement with a broad, parallel, collimated and uniform X- ray beam would be the most reliable test, without the need of a focal spot reconstruction as usually done in synchrotron light. To this end, we designed the BEaTriX (Beam Expander Testing X-ray facility) to be realized at INAF-OAB, devoted to the functional tests of the XOUs. A grazing incidence parabolic mirror and an asymmetrically cut crystal will produce a parallel X-ray beam broad enough to illuminate the entire aperture of the focusing elements. An X-ray camera at the focal distance from the mirrors will directly record the image. The selection of different crystals will enable to test the XOUs in the 1 - 5 keV range, included in the X-ray energy band of ATHENA (0.2-12 keV). In this paper we discuss a possible BEaTriX facility implementation. We also show a preliminary performance simulation of the optical system.

An expanded X-ray beam facility (BEaTriX) to test the modular elements of the ATHENA optics

E Buffagni;C Ferrari;
2015

Abstract

Future large X-ray observatories like ATHENA will be equipped with very large optics, obtained by assembling modular optical elements, named X-ray Optical Units (XOU) based on the technology of either Silicon Pore Optics or Slumped Glass Optics. In both cases, the final quality of the modular optic (a 5 arcsec HEW requirement for ATHENA) is determined by the accuracy alignment of the XOUs within the assembly, but also by the angular resolution of the individual XOU. This is affected by the mirror shape accuracy, its surface roughness, and the mutual alignment of the mirrors within the XOU itself. Because of the large number of XOUs to be produced, quality tests need to be routinely done to select the most performing stacked blocks, to be integrated into the final optic. In addition to the usual metrology based on profile and roughness measurements, a direct measurement with a broad, parallel, collimated and uniform X- ray beam would be the most reliable test, without the need of a focal spot reconstruction as usually done in synchrotron light. To this end, we designed the BEaTriX (Beam Expander Testing X-ray facility) to be realized at INAF-OAB, devoted to the functional tests of the XOUs. A grazing incidence parabolic mirror and an asymmetrically cut crystal will produce a parallel X-ray beam broad enough to illuminate the entire aperture of the focusing elements. An X-ray camera at the focal distance from the mirrors will directly record the image. The selection of different crystals will enable to test the XOUs in the 1 - 5 keV range, included in the X-ray energy band of ATHENA (0.2-12 keV). In this paper we discuss a possible BEaTriX facility implementation. We also show a preliminary performance simulation of the optical system.
2015
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
ATHENA
X-ray telescopes
segmented X-ray optics
X-ray tests
expanded beam
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/308783
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