Measurements of the refractive index of two different Lithosil samples and a sample of Suprasil 312 at cryogenic temperature and at 293 K are reported for the spectral range from 480 nm to 894 nm. Such data are useful for the design of fused silica optical components and systems destined for space missions.

Refractive index of Lithosil and Suprasil 312 at cryogenic temperature

Maurizio Vannoni;Andrea Sordini;Giuseppe Molesini
2010

Abstract

Measurements of the refractive index of two different Lithosil samples and a sample of Suprasil 312 at cryogenic temperature and at 293 K are reported for the spectral range from 480 nm to 894 nm. Such data are useful for the design of fused silica optical components and systems destined for space missions.
2010
Istituto Nazionale di Ottica - INO
Optical metrology
refractive index
cryogenic measurements
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/30991
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