A brief description of the scanning probe microscopies is given, with particular attention to atomic force microscopy (AFM) and near field optical microscopy (SNOM). We show examples of AFM used in friction mode and in topographic mode. The basic principles of SNOM are also presented, together with images obtained on artificial diamond films and on neuron networks.
Scanning probe microscopy applied to materials science and biology
Cricenti A;
2000
Abstract
A brief description of the scanning probe microscopies is given, with particular attention to atomic force microscopy (AFM) and near field optical microscopy (SNOM). We show examples of AFM used in friction mode and in topographic mode. The basic principles of SNOM are also presented, together with images obtained on artificial diamond films and on neuron networks.File in questo prodotto:
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