We present Bragg gratings with an effective index change introduced by implanting germanium at only 15KeV. An extinction ratio of 35dB at 1350nm is demonstrated for device lengths of 600?m, furthermore laser annealing is demonstrated. © 2011 IEEE.

Very low energy implanted Bragg gratings in SOI for wafer scale testing applications

Lulli G;
2011

Abstract

We present Bragg gratings with an effective index change introduced by implanting germanium at only 15KeV. An extinction ratio of 35dB at 1350nm is demonstrated for device lengths of 600?m, furthermore laser annealing is demonstrated. © 2011 IEEE.
2011
9781424483389
ion implantation
Bragg gratings
SOI
optoelectronics
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/312527
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