Chalcogenide glass optical fibers were fabricated into functional apertured probes for near field scanning infrared microscopy. Probe fiber tips were chemically etched and aluminum coated for the purpose of simultaneously collecting near field shear force and optical signals. Surface topography and infrared optical reflectivity data were obtained using the tips in a scanning near field microscope while illuminating an integrated microcircuit with the output from a free electron laser operating at a ? of 4.7 ?m. Approximately 25 nm topographical and 100 nm optical lateral resolution were observed.

Scanning near field infrared microscopy using chalcogenide fiber tips

Cricenti A;Luce M;
2000

Abstract

Chalcogenide glass optical fibers were fabricated into functional apertured probes for near field scanning infrared microscopy. Probe fiber tips were chemically etched and aluminum coated for the purpose of simultaneously collecting near field shear force and optical signals. Surface topography and infrared optical reflectivity data were obtained using the tips in a scanning near field microscope while illuminating an integrated microcircuit with the output from a free electron laser operating at a ? of 4.7 ?m. Approximately 25 nm topographical and 100 nm optical lateral resolution were observed.
2000
Inglese
42
5
339
344
http://www.scopus.com/record/display.url?eid=2-s2.0-0034140863&origin=inward
Sì, ma tipo non specificato
Infrared fibers
FEL
Reflectivity
SNOM
2
info:eu-repo/semantics/article
262
Talley, D. B.; Talley, D. B.; Shaw, L. B.; Sanghera, J. S.; Aggarwal, I. D.; Cricenti, A.; Generosi, R.; Luce, M.; Margaritondo, G.; Gilligan, J. M.; ...espandi
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/312837
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