In this study we modified and optimized a technique using an ordinary spin-coater device to deposit lipids on chemically etched silicon substrates. Tapping-mode atomic force microscopy is used for sample characterization, thereby realizing non destructive characterization with nanometrical resolution. © 2006 The Japan Society of Applied Physics.

Optimization of spin-coating-based technique to realize solid-supported lipid multilayers

Girasole Marco;Cricenti Antonio;
2006

Abstract

In this study we modified and optimized a technique using an ordinary spin-coater device to deposit lipids on chemically etched silicon substrates. Tapping-mode atomic force microscopy is used for sample characterization, thereby realizing non destructive characterization with nanometrical resolution. © 2006 The Japan Society of Applied Physics.
2006
Atomic Force Microscopy
Lipid multilayers
Nanometrical resolution
Silicon substrates
Spin-coating
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/312995
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? ND
social impact