In this paper, we describe how to define and build a set of known loads to be used in near-field microwave microscopy. Such loads are necessary to set up a microwave calibration kit, enabling local quantitative measurements by the microscope. The proposed protocol is validated through the microscopy system we have recently developed that combines a scanning tunneling microscope and a 70-GHz vector network analyzer.

Calibration Protocol for Broadband Near-Field Microwave Microscopy

Morini Antonio
2011

Abstract

In this paper, we describe how to define and build a set of known loads to be used in near-field microwave microscopy. Such loads are necessary to set up a microwave calibration kit, enabling local quantitative measurements by the microscope. The proposed protocol is validated through the microscopy system we have recently developed that combines a scanning tunneling microscope and a 70-GHz vector network analyzer.
2011
Istituto di Elettronica e di Ingegneria dell'Informazione e delle Telecomunicazioni - IEIIT
Calibration
microwave microscopy
nanotechnology
near-field imaging
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/313130
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