A THz Time Domain spectrometer was used to investigate painting layers in reflection geometry. The stratified layers were characterized and the refractive indexes were measured. The results were used for estimating the thicknesses of superimposed paint layers.

THz characterization of painting layers

Cacciari I;Ciofini D;Siano S
2015

Abstract

A THz Time Domain spectrometer was used to investigate painting layers in reflection geometry. The stratified layers were characterized and the refractive indexes were measured. The results were used for estimating the thicknesses of superimposed paint layers.
2015
Istituto di Fisica Applicata - IFAC
Painting layers
Refractive index
THz focusing lens
THz spectroscopy
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/314863
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