We present a newly constructed spectrometer for negative-ion/positive-ion coincidence spectroscopy of gaseous samples. The instrument consists of two time-of-flight ion spectrometers and a magnetic momentum filter for deflection of electrons. The instrument can measure double and triple coincidences between mass-resolved negative and positive ions with high detection efficiency. First results include identification of several negative-ion/positive-ion coincidence channels following inner-shell photoexcitation of sulfur hexafluoride (SF6).

A tandem time-of-flight spectrometer for negative-ion/positive-ion coincidence measurements with soft x-ray excitation

Kivimaki A;Coreno M;
2016

Abstract

We present a newly constructed spectrometer for negative-ion/positive-ion coincidence spectroscopy of gaseous samples. The instrument consists of two time-of-flight ion spectrometers and a magnetic momentum filter for deflection of electrons. The instrument can measure double and triple coincidences between mass-resolved negative and positive ions with high detection efficiency. First results include identification of several negative-ion/positive-ion coincidence channels following inner-shell photoexcitation of sulfur hexafluoride (SF6).
2016
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
Istituto Officina dei Materiali - IOM -
tandem time-of-flight spectrometer
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/318174
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