Generalized spectroscopic ellipsometry (g-SE) has been applied to many anisotropic materials. This measurement is based on the 2×2 Jones matrix sample representation, which is often sufficient. However, when the reflected or transmitted light becomes sufficiently depolarized, the Mueller-matrix (MM) representation may be required for anisotropic materials characterization. We report measurements of a 33.85 ?m thick liquid crystal layer sandwiched between two glass substrates. In addition to the sample anisotropy, the measurement is significantly depolarized. Mueller-matrix measurements are acquired in transmission as a function of wavelength, angle of incidence, and sample orientation to characterize the liquid crystal layer. Experimental measurements allow characterization of the liquid crystal anisotropy and orientation. © 2004 Elsevier B.V. All rights reserved.
Mueller-matrix characterization of liquid crystals
Marino Antigone;
2004
Abstract
Generalized spectroscopic ellipsometry (g-SE) has been applied to many anisotropic materials. This measurement is based on the 2×2 Jones matrix sample representation, which is often sufficient. However, when the reflected or transmitted light becomes sufficiently depolarized, the Mueller-matrix (MM) representation may be required for anisotropic materials characterization. We report measurements of a 33.85 ?m thick liquid crystal layer sandwiched between two glass substrates. In addition to the sample anisotropy, the measurement is significantly depolarized. Mueller-matrix measurements are acquired in transmission as a function of wavelength, angle of incidence, and sample orientation to characterize the liquid crystal layer. Experimental measurements allow characterization of the liquid crystal anisotropy and orientation. © 2004 Elsevier B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
