[object Object] The elastic properties of ZnO films have been investigated by means of the Brillouin scattering technique. Measurements were made of the phase velocity of surface phonons propagating on ZnO films ?0.2 ?m thick, deposited on both Si and Al2O3 substrates. A comparison of the experimental results with theoretical predictions shows that the elastic properties of the films, although appreciably different from those of the bulk material, are fairly close, however, to the properties observed in films almost two orders of magnitude thicker.

Investigation of elastic properties of ZnO films by Brillouin scattering

Verona E
1989

Abstract

[object Object] The elastic properties of ZnO films have been investigated by means of the Brillouin scattering technique. Measurements were made of the phase velocity of surface phonons propagating on ZnO films ?0.2 ?m thick, deposited on both Si and Al2O3 substrates. A comparison of the experimental results with theoretical predictions shows that the elastic properties of the films, although appreciably different from those of the bulk material, are fairly close, however, to the properties observed in films almost two orders of magnitude thicker.
1989
Thin films Elasticity II-VI semiconductors Zinc oxide films Brillouin scattering
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/323062
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