This chapter contains sections titled: Introduction AFM Characterization of Micro-Nano Surfaces and Interfaces of Carbon-Based Materials and PDMS-Au Nanocomposites 3D Image Processing: ImageJ Tools Scanning Capacitance Microscopy, Kelvin Probe Microscopy, and Electromagnetic Characterization AFM Artifacts Conclusions (General Guidelines for Material Characterization by AFM) Acknowledgments
AFM approaches to the study of PDMS-Au and carbon-based surfaces and interfaces
Senesi GS;
2016
Abstract
This chapter contains sections titled: Introduction AFM Characterization of Micro-Nano Surfaces and Interfaces of Carbon-Based Materials and PDMS-Au Nanocomposites 3D Image Processing: ImageJ Tools Scanning Capacitance Microscopy, Kelvin Probe Microscopy, and Electromagnetic Characterization AFM Artifacts Conclusions (General Guidelines for Material Characterization by AFM) AcknowledgmentsFile in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
