A theoretical framework is presented to treat both imaging and diffraction experiments performed with point-focus and line-focus Xray sources, with particular emphasis on two-dimensional and planar X-ray waveguides. In particular, point-projection and line-projection microscopy has been approached within the Huygens-Fresnel formalism; point-projection and line-projection diffraction, such as spatially-resolved Bragg/Laue diffraction of crystalline samples in a regime of dynamical scattering, has been treated both by means of the Huygens-Fresnel formalism and of the Takagi-Taupin dynamical theory. Both in point- and line- projection geometry, simply rotating the investigated crystalline samples, it is possible to switch from Fresnel self-imaging to Bragg/Laue diffraction conditions. This means to image, within the same experiment, either morphological features, with a sub-micrometric resolution, out of the exact diffraction condition, or the structure order on an atomic scale if placing the sample in diffraction. (c) 2006 Elsevier B.V. All rights reserved.
X-ray point and line-projection microscopy and diffraction
De Caro Liberato;Giannini Cinzia;Cedola Alessia;Bukreeva Inna
2006
Abstract
A theoretical framework is presented to treat both imaging and diffraction experiments performed with point-focus and line-focus Xray sources, with particular emphasis on two-dimensional and planar X-ray waveguides. In particular, point-projection and line-projection microscopy has been approached within the Huygens-Fresnel formalism; point-projection and line-projection diffraction, such as spatially-resolved Bragg/Laue diffraction of crystalline samples in a regime of dynamical scattering, has been treated both by means of the Huygens-Fresnel formalism and of the Takagi-Taupin dynamical theory. Both in point- and line- projection geometry, simply rotating the investigated crystalline samples, it is possible to switch from Fresnel self-imaging to Bragg/Laue diffraction conditions. This means to image, within the same experiment, either morphological features, with a sub-micrometric resolution, out of the exact diffraction condition, or the structure order on an atomic scale if placing the sample in diffraction. (c) 2006 Elsevier B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.