Recent advances in transmission electron microscopy and specimen preparation now permit the revival of an old idea, originally pioneered by Marton, of using single crystals as amplitude division beam splitters. As a first step in the direction of realizing a three crystal electron interferometer, we present results obtained from a double crystal interferometer, in which the gap between the two crystals is under experimental control and perfect registry is obtained by using focused ion beam milling to fabricate the interferometer from a single Si crystal.

New experiments with a double crystal electron interferometer

Grillo V;
2017

Abstract

Recent advances in transmission electron microscopy and specimen preparation now permit the revival of an old idea, originally pioneered by Marton, of using single crystals as amplitude division beam splitters. As a first step in the direction of realizing a three crystal electron interferometer, we present results obtained from a double crystal interferometer, in which the gap between the two crystals is under experimental control and perfect registry is obtained by using focused ion beam milling to fabricate the interferometer from a single Si crystal.
2017
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Istituto Nanoscienze - NANO
High resolution transmission electron microscopy
Ion beamsSingle crystals
Specimen preparation
Transmission electron microscopy
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/327998
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