We demonstrate a novel characterization method of van-der-Waals' materials by performing near-field-microscopy of hexagonal-boron-nitride thin films on single-crystal silver. Beyond determining dispersion of optical modes, this technique also enables the direct study of light-matter interactions.
Optical characterization of van der Waals materials via near-field microscopy
Ambrosio A;
2016
Abstract
We demonstrate a novel characterization method of van-der-Waals' materials by performing near-field-microscopy of hexagonal-boron-nitride thin films on single-crystal silver. Beyond determining dispersion of optical modes, this technique also enables the direct study of light-matter interactions.File in questo prodotto:
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