Coplanar Al/graphene/Al junctions fabricated on the same graphene sheet deposited on silicon carbide (SiC), show robust Josephson coupling at subKelvin temperature, when the separations between the electrodes is below 400 nm. Remarkably, a hysteretic Critical State sets in when ramping an orthogonal magnetic field, with a sudden collapse of the Josephson critical current Ic when turning the field on, and a revival of Ic when inverting the sweep. Similar hysteresis can be found in granular superconducting films which may undergo the Berezinskii-Kosterlitz- Thouless transition. Here, we give quantitative arguments to prove that this odd behavior of the magnetoconductance gives evidence for an incipient Berezinskii-Kosterlitz- Thouless transition with drift and pinning of fluctuating free vortices induced by the current bias.

Hysteretic Critical State in Coplanar Josephson Junction with Monolayer Graphene Barrier

Massarotti D;Campagnano G;Lucignano P;Stornaiuolo D;Pepe GP;Tafuri F;Tagliacozzo A
2017

Abstract

Coplanar Al/graphene/Al junctions fabricated on the same graphene sheet deposited on silicon carbide (SiC), show robust Josephson coupling at subKelvin temperature, when the separations between the electrodes is below 400 nm. Remarkably, a hysteretic Critical State sets in when ramping an orthogonal magnetic field, with a sudden collapse of the Josephson critical current Ic when turning the field on, and a revival of Ic when inverting the sweep. Similar hysteresis can be found in granular superconducting films which may undergo the Berezinskii-Kosterlitz- Thouless transition. Here, we give quantitative arguments to prove that this odd behavior of the magnetoconductance gives evidence for an incipient Berezinskii-Kosterlitz- Thouless transition with drift and pinning of fluctuating free vortices induced by the current bias.
2017
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
Inglese
30
1
5
14
http://www.scopus.com/inward/record.url?eid=2-s2.0-84994235332&partnerID=q2rCbXpz
Graphene
Josephson effect
Silicon carbide
7
info:eu-repo/semantics/article
262
Massarotti D.; Jouault B.; Rouco V.; Campagnano G.; Giuliano D.; Lucignano P.; Stornaiuolo D.; Pepe G.P.; Lombardi F.; Tafuri F.; Tagliacozzo A....espandi
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/335236
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