We report the successful growth of multiferroic (Nd,Fe)-doped PbTiO3 thin films with the composition (Pb0.88Nd0.08)(Ti0.93Fe0.05Mn0.02)O-3 (PNFT) using pulsed laser deposition. The deposited films have been investigated by XRD, SEM, energy-dispersive X-ray spectroscopy (EDS), secondary-ion mass spectroscopy (SIMS), atomic force microscopy, magnetic force microscopy, piezoforce microscopy, spectroscopic ellipsometry (SE) and dielectric spectroscopy measurements. PNFT films deposited on different substrates (MgO, SrTiO3 and Nb:SrTiO3) are (001) oriented, preserving the orientation of the single-crystal substrates. EDS mapping and SIMS across the film thickness probed the uniform distribution of all the elements. The refractive index and extinction coefficient have been obtained with the SE software package and refined with an optical-graded model. Magnetic domains and ferroelectric domains have been evidenced at microscopic scale. Good dielectric properties and low loss, comparable to those of bulk materials, have been obtained.

Multiferroic (Nd,Fe)-doped PbTiO3 thin films obtained by pulsed laser deposition

Craciun F;Galassi C;
2019

Abstract

We report the successful growth of multiferroic (Nd,Fe)-doped PbTiO3 thin films with the composition (Pb0.88Nd0.08)(Ti0.93Fe0.05Mn0.02)O-3 (PNFT) using pulsed laser deposition. The deposited films have been investigated by XRD, SEM, energy-dispersive X-ray spectroscopy (EDS), secondary-ion mass spectroscopy (SIMS), atomic force microscopy, magnetic force microscopy, piezoforce microscopy, spectroscopic ellipsometry (SE) and dielectric spectroscopy measurements. PNFT films deposited on different substrates (MgO, SrTiO3 and Nb:SrTiO3) are (001) oriented, preserving the orientation of the single-crystal substrates. EDS mapping and SIMS across the film thickness probed the uniform distribution of all the elements. The refractive index and extinction coefficient have been obtained with the SE software package and refined with an optical-graded model. Magnetic domains and ferroelectric domains have been evidenced at microscopic scale. Good dielectric properties and low loss, comparable to those of bulk materials, have been obtained.
2019
Istituto di Scienza, Tecnologia e Sostenibilità per lo Sviluppo dei Materiali Ceramici - ISSMC (ex ISTEC)
Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata
PNFT
thin film
multiferroic
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/344753
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