We perform a combined experimental and theoretical approach to establish the atomistic origin of energy dissipation occurring while imaging a molecular surface with an amplitude modulation atomic force microscope. We show that the energy transferred by a single nano-asperity to a sexithiophene monolayer is about 0.15 eV/cycle. The configuration space sampled by the tip depends on whether it approaches or withdraws from the surface. The asymmetry arises because of the presence of energy barriers among different deformations of the molecular geometry. This is the source of the material contrast provided by the phase-shift images.

Molecular scale energy dissipation in oligothiophene monolayers measured by dynamic force microscopy

Cristiano Albonetti;Fabio Biscarini;
2009

Abstract

We perform a combined experimental and theoretical approach to establish the atomistic origin of energy dissipation occurring while imaging a molecular surface with an amplitude modulation atomic force microscope. We show that the energy transferred by a single nano-asperity to a sexithiophene monolayer is about 0.15 eV/cycle. The configuration space sampled by the tip depends on whether it approaches or withdraws from the surface. The asymmetry arises because of the presence of energy barriers among different deformations of the molecular geometry. This is the source of the material contrast provided by the phase-shift images.
2009
Istituto per lo Studio dei Materiali Nanostrutturati - ISMN
Inglese
20
43
434021
7
http://stacks.iop.org/0957-4484/20/i=43/a=434021
Sì, ma tipo non specificato
ULTRA-THIN FILMS
TAPPING-MODE
RESOLUTION IMAGES
SEXITHIOPHENE
ORGANIZATION
2
info:eu-repo/semantics/article
262
Nicolas Martinez; Waichek Kaminski; Carlos Gomez; Cristiano Albonetti; Fabio Biscarini; Ruben Perez; Ricardo Garcia
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/34672
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