Summary form only given. According to rigorous diffraction theory, monochromatic electromagnetic waves reflected from a material surface form a mixture of propagating and evanescent waves. During propagation, light fields suffer a progressive spatial filtering that depends exponentially on the size of the subwavelength image detail, a peculiar multiscale distortion in the image that spans the near-field of the sources, occurs in vacuum and with no dissipation, and has never been reported before.Here we explore this transition from super-resolved to diffraction-limited imaging for THz frequencies (? = 1 mm). The experiment is carried out using a knife-edge scan, that allows subwavelength beam profiling in the near-field of emitters [1], here enacted remotely to produce super-resolved images on planes at different distances from the emitters [2]. Compared to visible light imaging, the millimetric wavelength expands the near-field region to the point that single near-field imaging planes can be scanned using a mechanical free-standing blade.

Observation of evanescent-wave filtering in super-resolved THz images

2017

Abstract

Summary form only given. According to rigorous diffraction theory, monochromatic electromagnetic waves reflected from a material surface form a mixture of propagating and evanescent waves. During propagation, light fields suffer a progressive spatial filtering that depends exponentially on the size of the subwavelength image detail, a peculiar multiscale distortion in the image that spans the near-field of the sources, occurs in vacuum and with no dissipation, and has never been reported before.Here we explore this transition from super-resolved to diffraction-limited imaging for THz frequencies (? = 1 mm). The experiment is carried out using a knife-edge scan, that allows subwavelength beam profiling in the near-field of emitters [1], here enacted remotely to produce super-resolved images on planes at different distances from the emitters [2]. Compared to visible light imaging, the millimetric wavelength expands the near-field region to the point that single near-field imaging planes can be scanned using a mechanical free-standing blade.
2017
Istituto dei Sistemi Complessi - ISC
Inglese
The European Conference on Lasers and Electro-Optics, CLEO_Europe 2017
Part F82-CLEO_Europe 2017
http://www.scopus.com/inward/record.url?eid=2-s2.0-85039919338&partnerID=q2rCbXpz
25 June 2017 through 29 June 2017
Munich; Germany
Spatial resolution
Diffraction
Blades
Fourier transforms
Microscopy
0
none
Flammini M.; Pontecorvo E.; Giliberti V.; Ortolani M.; DelRe E.
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/348390
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