A comparative study of diode structures based on semi-insulating (SI) GaAs with evaporated Mg vs. Pt contacts is presented. Electric field strength in the vicinity of the contacts is inferred from the detection of alpha-particles emitted from Am-241 radioisotope. It is shown that at zero bias, the structure with Mg-based contacts (MgO/SI GaAs) gives comparatively small signal implying an ohmic behaviour. Contrary, the structure with Pt contacts reveals presence of a non-negligible electric field near the contacts at zero bias voltage, thus indicating presence of a sizeable space charge region near the interface. The results are supplemented by insights from atomistic electronic structure modeling of idealized GaAs/Pt vs. GaAs/Mg and GaAs/MgO interfaces.

Charge collection efficiency of Pt vs. Mg contacts on semi-insulating GaAs

Gombia E;
2019

Abstract

A comparative study of diode structures based on semi-insulating (SI) GaAs with evaporated Mg vs. Pt contacts is presented. Electric field strength in the vicinity of the contacts is inferred from the detection of alpha-particles emitted from Am-241 radioisotope. It is shown that at zero bias, the structure with Mg-based contacts (MgO/SI GaAs) gives comparatively small signal implying an ohmic behaviour. Contrary, the structure with Pt contacts reveals presence of a non-negligible electric field near the contacts at zero bias voltage, thus indicating presence of a sizeable space charge region near the interface. The results are supplemented by insights from atomistic electronic structure modeling of idealized GaAs/Pt vs. GaAs/Mg and GaAs/MgO interfaces.
2019
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Semi-insulating GaAs; Schottky barrier; Metal-semiconductor contact; Metal-oxide-semiconductor contact; Charge collection efficiency
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/357110
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