We report on the first application of time-resolved reflectance spectroscopy in the orchards for the nondestructive assessment of apple optical properties during growth. A portable dual-wavelength (650 nm, 780 nm) system was developed and used to assess the absorption coefficient and the reduced scattering coefficient of apples during growth.
Nondestructive assessment of apple optical properties during growth by time-resolved reflectance spectroscopy in the orchards
Torricelli Alessandro;Spinelli Lorenzo
2015
Abstract
We report on the first application of time-resolved reflectance spectroscopy in the orchards for the nondestructive assessment of apple optical properties during growth. A portable dual-wavelength (650 nm, 780 nm) system was developed and used to assess the absorption coefficient and the reduced scattering coefficient of apples during growth.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
