We present the electrical characterization of mono and bilayer MoS 2 back-gate field-effect transistors with ohmic or Schottky contacts. We investigate features such as persistent photoconductivity, hysteresis and field emission

Persistent photoconductivity, hysteresis and field emission in MoS2 back-gate field-effect transistors

Giubileo F;Luongo G;Urban F;
2019

Abstract

We present the electrical characterization of mono and bilayer MoS 2 back-gate field-effect transistors with ohmic or Schottky contacts. We investigate features such as persistent photoconductivity, hysteresis and field emission
2019
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
9781538610169
field effect transistors
field emission
hysteresis
MoS 2
photoconductivity
Schottky barrier
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/363406
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