A new type of X-ray facility, the Beam Expander Testing X-ray facility (BEaTriX), has been designed and is now under construction at INAF-Osservatorio Astronomico di Brera (Merate, Italy) to perform the acceptance tests of the silicon pore optics modules of the ATHENA X-ray telescope. Crystals of high perfection and large dimensions are needed in order to obtain a wide beam (20 x 6cm) with an X-ray divergence of <0.5 and an X-ray energy purity E/E < 10(-5). To generate X-ray diffracted beams at an X-ray energy of 1.49keV, ammonium dihydrogen phosphate (ADP) crystals have been considered among other possible choices, because of their reported crystal quality and because they can be grown at sufficiently large size at a reasonable price. In the present paper, the results of the characterization of crystalline quality and lattice planarity of a 20 x 20 x 2 mm ADP sample are reported.

Characterization of ammonium dihydrogen phosphate crystals for soft X-ray optics of the Beam Expander Testing X-ray facility (BEaTriX)

Ferrari Claudio;Beretta Sara;
2019

Abstract

A new type of X-ray facility, the Beam Expander Testing X-ray facility (BEaTriX), has been designed and is now under construction at INAF-Osservatorio Astronomico di Brera (Merate, Italy) to perform the acceptance tests of the silicon pore optics modules of the ATHENA X-ray telescope. Crystals of high perfection and large dimensions are needed in order to obtain a wide beam (20 x 6cm) with an X-ray divergence of <0.5 and an X-ray energy purity E/E < 10(-5). To generate X-ray diffracted beams at an X-ray energy of 1.49keV, ammonium dihydrogen phosphate (ADP) crystals have been considered among other possible choices, because of their reported crystal quality and because they can be grown at sufficiently large size at a reasonable price. In the present paper, the results of the characterization of crystalline quality and lattice planarity of a 20 x 20 x 2 mm ADP sample are reported.
2019
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
X-ray astronomy
ammonium dihydrogen phosphate
ADP
crystalline perfection
X-ray topography
residual strain measurement
lattice plane curvature measurement
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/365222
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