In this method three different samples were mixed in ethanol; o 50/50-BM: (50 % B4C - 50 % TiB2) powders were ball milled with WC balls o 50/45/5-BM: (50 % B4C - 45 % TiB2 - 5% WC) powders were soft ball milled with WC balls o 50/50-HEM: (50 % B4C - 50 % TiB2) powders were high energy ball milled with WC-Co balls Dried and sieved powders then sintered by using hot press at 1930°C for 20 minutes with 30MPa pressure under vacuum. Produced samples were characterized by using, Rigaku MiniFlex X-Ray diffractometer , Zeiss Supra 50 VP scanning electron microscope (SEM) and 200kV JEOL JEM-2100F transmission electron microscope (TEM) equipped with STEM high angle annular dark field detector and JEOL JED-2300T energy dispersive spectrometer and precession electron diffraction (PED); automated phase and orientation mapping unit (NanoMEGAS, Digistar P1000 scan generator with ASTAR V2 software package). TEM samples were prepared with JEOL JIB-4601 multibeam FIB-SEM system. Mechanical properties were measured by using EmcoTest hardness (Vickers) testing equipment.

Directional Property Characterization of Hot Pressed B4C-TiB2 Composites Doped With WC

Simone Failla;Diletta Sciti;
2019

Abstract

In this method three different samples were mixed in ethanol; o 50/50-BM: (50 % B4C - 50 % TiB2) powders were ball milled with WC balls o 50/45/5-BM: (50 % B4C - 45 % TiB2 - 5% WC) powders were soft ball milled with WC balls o 50/50-HEM: (50 % B4C - 50 % TiB2) powders were high energy ball milled with WC-Co balls Dried and sieved powders then sintered by using hot press at 1930°C for 20 minutes with 30MPa pressure under vacuum. Produced samples were characterized by using, Rigaku MiniFlex X-Ray diffractometer , Zeiss Supra 50 VP scanning electron microscope (SEM) and 200kV JEOL JEM-2100F transmission electron microscope (TEM) equipped with STEM high angle annular dark field detector and JEOL JED-2300T energy dispersive spectrometer and precession electron diffraction (PED); automated phase and orientation mapping unit (NanoMEGAS, Digistar P1000 scan generator with ASTAR V2 software package). TEM samples were prepared with JEOL JIB-4601 multibeam FIB-SEM system. Mechanical properties were measured by using EmcoTest hardness (Vickers) testing equipment.
2019
Istituto di Scienza, Tecnologia e Sostenibilità per lo Sviluppo dei Materiali Ceramici - ISSMC (ex ISTEC)
Boron carbide
Scanning Transmission Electron Microscopy
X-Ray Diffraction
Titanium diboride
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/368001
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