The symposium V entitled "Stress, structure and stoichiometry effects on the properties of nanomaterials" was organized for the third time during the European Materials Research Society Fall Meeting 2015 in Warsaw, following the previous two successful symposia held in 2011 and 2013. Four sessions were jointly organized with the symposium W entitled "Nanoscale separations in spintronic materials, superconductors, and other systems". Both symposia (V and W) were co-organized by the EU 7-th Framework Programme under the project REGPOT-CT-2013-316014 (EAgLE). Overall, more than 70 scientists attended the symposium V, as they presented 10 invited talks, 26 oral contributions and 28 posters, covering many different and new subjects in nanostructures, thin films and interfaces. Representative articles are published in this proceedings volume. We would like to thank the participants who submitted high quality articles and the referees who helped us with excellent and timely reports.
Editorial
Sergio D'Addato;
2017
Abstract
The symposium V entitled "Stress, structure and stoichiometry effects on the properties of nanomaterials" was organized for the third time during the European Materials Research Society Fall Meeting 2015 in Warsaw, following the previous two successful symposia held in 2011 and 2013. Four sessions were jointly organized with the symposium W entitled "Nanoscale separations in spintronic materials, superconductors, and other systems". Both symposia (V and W) were co-organized by the EU 7-th Framework Programme under the project REGPOT-CT-2013-316014 (EAgLE). Overall, more than 70 scientists attended the symposium V, as they presented 10 invited talks, 26 oral contributions and 28 posters, covering many different and new subjects in nanostructures, thin films and interfaces. Representative articles are published in this proceedings volume. We would like to thank the participants who submitted high quality articles and the referees who helped us with excellent and timely reports.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.