In both light optics and electron optics, the amplitude of a wave scattered by an object is an observable that is usually recorded in the form of an intensity distribution in a real space image or a diffraction image. In contrast, retrieval of the phase of a scattered wave is a well-known challenge, which is usually approached by interferometric or numerical methods. In electron microscopy, as a result of constraints in the lens setup, it is particularly difficult to retrieve the phase of a diffraction image. Here, we use a "defocused beam" generated by a nanofabricated hologram to form a reference wave that can be interfered with a diffracted beam. This setup provides an extended interference region with the sample wavefunction in the Fraunhofer plane. As a case study, we retrieve the phase of an electron vortex beam. Beyond this specific example, the approach can be used to retrieve the wavefronts of diffracted beams from a wide range of samples.

Phase retrieval of an electron vortex beam using diffraction holography

Venturi F;Gazzadi GC;Balboni R;Frabboni S;Grillo V
2017

Abstract

In both light optics and electron optics, the amplitude of a wave scattered by an object is an observable that is usually recorded in the form of an intensity distribution in a real space image or a diffraction image. In contrast, retrieval of the phase of a scattered wave is a well-known challenge, which is usually approached by interferometric or numerical methods. In electron microscopy, as a result of constraints in the lens setup, it is particularly difficult to retrieve the phase of a diffraction image. Here, we use a "defocused beam" generated by a nanofabricated hologram to form a reference wave that can be interfered with a diffracted beam. This setup provides an extended interference region with the sample wavefunction in the Fraunhofer plane. As a case study, we retrieve the phase of an electron vortex beam. Beyond this specific example, the approach can be used to retrieve the wavefronts of diffracted beams from a wide range of samples.
2017
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Istituto per la Microelettronica e Microsistemi - IMM
Istituto Nanoscienze - NANO
Holography
Crystallography
Three dimensional image processing
Nanofabrication
Electron microscopy
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/371373
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