Magnetoplasmas in ECR-Ion Sources are excited from gaseous elements or vapours by microwaves in the range 2.45-28 GHz via Electron Cyclotron Resonance. A B-minimum, magnetohydrodynamic stable configuration is used for trapping the plasma. The values of plasma density, temperature and confinement times are typically n(e) = 10(11)-10(13) cm(-3), 1 eV < T-e < 100 keV, 0 : 001 < t(c) < 1 s. At INFN-LNS several diagnostics tools have been developed for probing the electromagnetic emission of such plasmas, in the optical/X-ray domain. Fast Silicon Drift detectors with high energy resolution of 125 eV at 5.9 keV have been used for the characterization of plasma emission at 2 < E < 30 keV. In the domain 0.4-17 keV an X-ray pin-hole camera technique has allowed space resolved X-ray spectroscopy with a spatial resolution down to 30 mu m and an energy resolution down to 140 eV at 5.9 keV. In parallel, imaging in the optical range and spectroscopic measurements have been carried out. Relative abundances of H/H-2 atoms/molecules in the plasmas have been measured for different values of neutral pressure, microwave power and magnetic field profile (they are critical for high-power proton sources).
Electromagnetic diagnostics of ECR-Ion Sources plasmas: optical/X-ray imaging and spectroscopy
Caliri C;Romano F P;
2017
Abstract
Magnetoplasmas in ECR-Ion Sources are excited from gaseous elements or vapours by microwaves in the range 2.45-28 GHz via Electron Cyclotron Resonance. A B-minimum, magnetohydrodynamic stable configuration is used for trapping the plasma. The values of plasma density, temperature and confinement times are typically n(e) = 10(11)-10(13) cm(-3), 1 eV < T-e < 100 keV, 0 : 001 < t(c) < 1 s. At INFN-LNS several diagnostics tools have been developed for probing the electromagnetic emission of such plasmas, in the optical/X-ray domain. Fast Silicon Drift detectors with high energy resolution of 125 eV at 5.9 keV have been used for the characterization of plasma emission at 2 < E < 30 keV. In the domain 0.4-17 keV an X-ray pin-hole camera technique has allowed space resolved X-ray spectroscopy with a spatial resolution down to 30 mu m and an energy resolution down to 140 eV at 5.9 keV. In parallel, imaging in the optical range and spectroscopic measurements have been carried out. Relative abundances of H/H-2 atoms/molecules in the plasmas have been measured for different values of neutral pressure, microwave power and magnetic field profile (they are critical for high-power proton sources).I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
