The alpha-PIXE technique allowed to determine the compositional pattern of the glass matrix in the three artworks; the XRF imaging performed by scanning the sample surface allowed to obtain the signature of opacifying and coloring agents.
Particle induced X-ray emission performed with alpha particles (alpha-PIXE) and scanning X-ray fluorescence (XRF) imaging have been used for the non-invasive investigation of three enameled artworks dated back to the XI-XII century AD. The attribution of the three objects has been performed based on art historical considerations even if an analytical investigation was never applied to confirm their authenticity.
Identification of forgeries in historical enamels by combining the non-destructive scanning XRF imaging and alpha-PIXE portable techniques
Caliri C;Pappalardo L;Romano FP
2016
Abstract
Particle induced X-ray emission performed with alpha particles (alpha-PIXE) and scanning X-ray fluorescence (XRF) imaging have been used for the non-invasive investigation of three enameled artworks dated back to the XI-XII century AD. The attribution of the three objects has been performed based on art historical considerations even if an analytical investigation was never applied to confirm their authenticity.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
