We have fabricated series arrays of closely spaced planar Josephson junctions on MgB2 films using a 30 keV focused helium ion beam. Uniformity of junction parameters within the arrays is sufficient for achieving phase-lock into an applied microwave signal, and flat giant Shapiro steps are observed. The spread in critical current of a 60-Josephson junction array is estimated to be less than 3.5%, significantly better than reported in MgB2 junctions fabricated by other techniques. These results demonstrate the potential of the focused He+ ion beam irradiation technique in MgB2 Josephson multi-junction circuit applications such as quantum voltage standards.

Reduced Critical Current Spread in Planar MgB2 Josephson Junction Array Made by Focused Helium Ion Beam

Davidson Bruce A;
2019

Abstract

We have fabricated series arrays of closely spaced planar Josephson junctions on MgB2 films using a 30 keV focused helium ion beam. Uniformity of junction parameters within the arrays is sufficient for achieving phase-lock into an applied microwave signal, and flat giant Shapiro steps are observed. The spread in critical current of a 60-Josephson junction array is estimated to be less than 3.5%, significantly better than reported in MgB2 junctions fabricated by other techniques. These results demonstrate the potential of the focused He+ ion beam irradiation technique in MgB2 Josephson multi-junction circuit applications such as quantum voltage standards.
2019
Istituto Officina dei Materiali - IOM -
Focused helium ion microscope (HIM)
Josephson junction and series array
lumped array
MgB2
voltage metrology
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/379072
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