The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (V ector Network A nalyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
A Method for On-Wafer Experimental Characterization of a 4-Port Circuit, Using a 2-Port Vector Network Analyze
Marcelli R;Bartolucci G;
2009
Abstract
The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (V ector Network A nalyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.File in questo prodotto:
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