We have measured the angular distribution of Ge L3M45M45 Auger electrons in coincidence with Ge 2p3/2 core photoelectrons along the (001) azimuth of the Ge(100) surface. Intensity modulations arising from diffraction effects are suppressed in the coincidence Auger angular distribution and, when specific emission angles of the photoelectrons are considered, new features appear. We attribute the former effect to enhanced surface specificity of the coincidence technique and the latter to sensitivity of the coincidence measurement to alignment of the core hole state.
Angle-resolved Auger-photoelectron coincidence spectroscopy (AR-APECS) of the Ge(100) surface
S Iacobucci;
2003
Abstract
We have measured the angular distribution of Ge L3M45M45 Auger electrons in coincidence with Ge 2p3/2 core photoelectrons along the (001) azimuth of the Ge(100) surface. Intensity modulations arising from diffraction effects are suppressed in the coincidence Auger angular distribution and, when specific emission angles of the photoelectrons are considered, new features appear. We attribute the former effect to enhanced surface specificity of the coincidence technique and the latter to sensitivity of the coincidence measurement to alignment of the core hole state.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
