A CCD calibration system based on a laser-plasma X-ray source has been developed. The system is particularly suited for CCD calibration in the soft X-ray spectral range and allows the user to continuously tune in energy the incident radiation. This last issue is of great interest when studying the X-ray response of Si detectors near the K-edge. We report on the use of this facility for calibration of a back-illuminated CCD for single-photon spectroscopy of laser-plasma emission.

A laser-plasma source for CCD calibration in the soft X-ray range

Giulietti A;Giulietti D;Gizzi LA;
2002

Abstract

A CCD calibration system based on a laser-plasma X-ray source has been developed. The system is particularly suited for CCD calibration in the soft X-ray spectral range and allows the user to continuously tune in energy the incident radiation. This last issue is of great interest when studying the X-ray response of Si detectors near the K-edge. We report on the use of this facility for calibration of a back-illuminated CCD for single-photon spectroscopy of laser-plasma emission.
2002
Istituto per i Processi Chimico-Fisici - IPCF
Istituto Nazionale di Ottica - INO
EMISSION
EFFICIENCY
RESOLUTION
SCATTERING
DETECTOR
SILICON
BOARD
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/38720
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 32
  • ???jsp.display-item.citation.isi??? ND
social impact