Pre-formed Ag nanoparticles (NPs) and Ag@CaF2 core-shell NPs are physically synthesized using DC magnetron-based NP source and deposited on Si-SiOx wafers. The samples are prepared by co-depositing Ag nanoparticles and CaF2 produced by an evaporation source, or by sequential deposition method, i.e., by depositing in a sequence a CaF2 buffer layer, the Ag NPs generated by the NP source and a capping CaF2 layer. The supported films are characterized by Scanning Electron Microscopy (SEM), X-ray Photoelectron Spectroscopy (XPS), and Surface Differential Reflectivity (SDR). SEM shows that Ag NPs deposited directly on Si-SiOx tend to diffuse and to agglomerate, affecting the size distribution of the nanostructures. The presence of a CaF2 buffer layer between Ag and Si-SiOx limits this effect, while XPS reveals electrical charging, caused by the insulating nature of the CaF2 continuous film. The surface plasmon resonance behavior for different samples is analyzed using SDR with p-polarized light. There is a clear evidence of a blue shift in the plasmon excitation due to the presence of CaF2 on Si, which can represent a potential advantage for the technological applications in photovoltaics and optoelectronics.
Physical Synthesis and Study of Ag@CaF2 Core@Shell Nanoparticles: Morphology and Tuning of Optical Properties
Sergio D'Addato;Sergio Valeri;
2019
Abstract
Pre-formed Ag nanoparticles (NPs) and Ag@CaF2 core-shell NPs are physically synthesized using DC magnetron-based NP source and deposited on Si-SiOx wafers. The samples are prepared by co-depositing Ag nanoparticles and CaF2 produced by an evaporation source, or by sequential deposition method, i.e., by depositing in a sequence a CaF2 buffer layer, the Ag NPs generated by the NP source and a capping CaF2 layer. The supported films are characterized by Scanning Electron Microscopy (SEM), X-ray Photoelectron Spectroscopy (XPS), and Surface Differential Reflectivity (SDR). SEM shows that Ag NPs deposited directly on Si-SiOx tend to diffuse and to agglomerate, affecting the size distribution of the nanostructures. The presence of a CaF2 buffer layer between Ag and Si-SiOx limits this effect, while XPS reveals electrical charging, caused by the insulating nature of the CaF2 continuous film. The surface plasmon resonance behavior for different samples is analyzed using SDR with p-polarized light. There is a clear evidence of a blue shift in the plasmon excitation due to the presence of CaF2 on Si, which can represent a potential advantage for the technological applications in photovoltaics and optoelectronics.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.