Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under temperature or radiation stress. For all the investigated polymer: fullerene, silicon and perovskite solar cells this technique evidences a clear correlation of the recombination and the transport processes with the device performances.

Noise Spectroscopy As A Tool For The Characterization Of Perovskite, Organic And Silicon Solar Cells

Barone C;Pagano S
2019

Abstract

Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under temperature or radiation stress. For all the investigated polymer: fullerene, silicon and perovskite solar cells this technique evidences a clear correlation of the recombination and the transport processes with the device performances.
2019
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/390504
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