This report describes a software package developed at the Institute for Plasma Science and Technology (ISTP-CNR) for the analysis of X-ray Photoelectron Spectroscopy (XPS) spectra, which represent the emission of electrons from materials subjected to X-ray irradiation. XPS analysis is a powerful technique for identifying the chemical elements present in a material and determining their chemical states and bonding environments. Since the Institute's XPS facility is a custom-built, non-commercial system, a dedicated software tool was developed to provide accurate and reliable interpretation of the experimental data. The software processes experimental spectra through a deconvolution procedure, separating the individual contributions that constitute each spectral peak. It can handle up to eight peak groups and implements two mathematical models: the Voigt function, suitable for symmetric peaks, and the Doniach-Sunjic function, which provides a more realistic description of asymmetric peaks by accounting for the electronic response characteristic of complex materials. The program also offers different background subtraction models (including Shirley) , allowing users to remove the spectral baseline and isolate the chemically relevant signal components. The report presents representative examples of XPS data analysis in which the deconvolution procedure enables the identification of different chemical states of carbon and nitrogen within a material. Finally, possible future developments are discussed, including the implementation of more advanced background models to further improve the accuracy and reliability of spectral interpretation
Il report descrive un software sviluppato in Istituto (ISTP-CNR) per analizzare gli spettri XPS, cioè quei grafici che mostrano come gli elettroni vengono emessi dai materiali quando sono colpiti da raggi X. Questa analisi serve a capire quali elementi chimici sono presenti e come sono legati tra loro. Poiché l’impianto XPS dell’Istituto non è commerciale, è stato necessario creare un programma dedicato che permettesse di interpretare i dati in modo accurato. Il software legge i dati sperimentali e li “deconvolve”, cioè separa i vari contributi che compongono ogni picco dello spettro. Può gestire fino a otto gruppi di picchi e utilizza due tipi di funzioni matematiche: la Voigt, per i segnali simmetrici, e la Doniac Sunjic, utile quando i picchi sono asimmetrici perché descrive meglio il comportamento fisico degli elettroni nei materiali complessi. Il programma permette anche di scegliere diversi tipi di “fondo” (incluso il fondo di Shirley), cioè la linea di base da sottrarre ai dati per isolare i segnali utili. Il report mostra esempi reali di analisi, in cui la deconvoluzione consente di identificare le diverse forme chimiche del carbonio e dell’azoto in un materiale. Infine, vengono descritti i possibili sviluppi futuri, come l’integrazione di modelli di fondo più avanzati per migliorare ulteriormente la precisione dell’analisi
SOFTWARE PER LA DECONVOLUZIONE DEGLI SPETTRI DI FOTOEMISSIONE
Ghezzi F
;De Vecchi L
2021
Abstract
This report describes a software package developed at the Institute for Plasma Science and Technology (ISTP-CNR) for the analysis of X-ray Photoelectron Spectroscopy (XPS) spectra, which represent the emission of electrons from materials subjected to X-ray irradiation. XPS analysis is a powerful technique for identifying the chemical elements present in a material and determining their chemical states and bonding environments. Since the Institute's XPS facility is a custom-built, non-commercial system, a dedicated software tool was developed to provide accurate and reliable interpretation of the experimental data. The software processes experimental spectra through a deconvolution procedure, separating the individual contributions that constitute each spectral peak. It can handle up to eight peak groups and implements two mathematical models: the Voigt function, suitable for symmetric peaks, and the Doniach-Sunjic function, which provides a more realistic description of asymmetric peaks by accounting for the electronic response characteristic of complex materials. The program also offers different background subtraction models (including Shirley) , allowing users to remove the spectral baseline and isolate the chemically relevant signal components. The report presents representative examples of XPS data analysis in which the deconvolution procedure enables the identification of different chemical states of carbon and nitrogen within a material. Finally, possible future developments are discussed, including the implementation of more advanced background models to further improve the accuracy and reliability of spectral interpretation| File | Dimensione | Formato | |
|---|---|---|---|
|
prod_453043-doc_171302.pdf
solo utenti autorizzati
Descrizione: Rapporto tecnico SOFTWARE PER LA DECONVOLUZIONE DEGLI SPETTRI DI FOTOEMISSIONE
Tipologia:
Versione Editoriale (PDF)
Licenza:
Dominio pubblico
Dimensione
1.04 MB
Formato
Adobe PDF
|
1.04 MB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.


