I discuss on an XPS analysis of CeO thin films offered by Murugan et al. in a recent article, Superlatt. Microstruct. 85 (2015) 321. I argue that the authors' interpretation is not an accurate picture of the chemical composition of their material, especially not the mapping of the Ce(IV)-Ce(III) redox couple, because such interpretation largely overlooks the quantum mechanics principles and electron correlation phenomena that govern the binding energies and mutual intensities of photoemission peaks in the Ce3d spectrum.
On the number, binding energies, and mutual intensities of Ce3d peaks in the XPS analysis of cerium oxide systems: A response to Murugan et al., Superlatt. Microstruct. 85 (2015) 321
Paparazzo E
2017
Abstract
I discuss on an XPS analysis of CeO thin films offered by Murugan et al. in a recent article, Superlatt. Microstruct. 85 (2015) 321. I argue that the authors' interpretation is not an accurate picture of the chemical composition of their material, especially not the mapping of the Ce(IV)-Ce(III) redox couple, because such interpretation largely overlooks the quantum mechanics principles and electron correlation phenomena that govern the binding energies and mutual intensities of photoemission peaks in the Ce3d spectrum.File in questo prodotto:
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