A comparison among O/Cr atomic ratios obtained from XPS Cr 2p3/2 and O 1s spectra in pure inorganic compounds, employing the Elemental Sensitivity Factors approach and the so-called 'First-Principles Model' is reported.
SURFACE QUANTITATIVE-ANALYSIS OF CR-O SYSTEMS BY XPS
BATTISTONI C;PAPARAZZO E
1983
Abstract
A comparison among O/Cr atomic ratios obtained from XPS Cr 2p3/2 and O 1s spectra in pure inorganic compounds, employing the Elemental Sensitivity Factors approach and the so-called 'First-Principles Model' is reported.File in questo prodotto:
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