Analysis of a particular microstrip structure for characterizing dielectric materials by means of TDR technique

In this paper a particular measurement configuration for characterizing dielectric materials by means of Time Domain Reflectometry (TDR) technique is proposed and studied. The holder of the dielectric samp1e is obtained from a shielded microstrip line by placing the dielectric material between the strip and the upper ground plane of the transmission system. Die1ectric samples of slab form are used and no parti3ular requirement exists for thickness and length. Theoretical calibration diagrams are obtained which re1ate the measured reflection coefficient to the dielectric permittivity at high and low frequencies.