Using a large set of silicate crystals, characterized by Structure REFinement (SREF), Electron Probe Micro-Analysis (EPMA) and Secondary Ion Mass Spectrometry (SIMS), and mounted with known crystallographic orientation [1], we propose a new SIMS quantification for H, B and F (from ppm level to several wt.%), using 27Al+ and 44Ca+, in turn, as the reference isotope for the matrix, and propose suitable calibration standards to obtain accurate results. The final SIMS data are then compared to those obtained using Si as the reference element, with those available from EMPA (B and F), and with the crystallographic constraints derived from SREF investigation. The results of this study can be extended to the measurement of light elements in complex silicate or non-silicate samples.
Strategies for Quantification of Light Elements in Minerals by SIMS: H, B and F.
Ottolini L;
2006
Abstract
Using a large set of silicate crystals, characterized by Structure REFinement (SREF), Electron Probe Micro-Analysis (EPMA) and Secondary Ion Mass Spectrometry (SIMS), and mounted with known crystallographic orientation [1], we propose a new SIMS quantification for H, B and F (from ppm level to several wt.%), using 27Al+ and 44Ca+, in turn, as the reference isotope for the matrix, and propose suitable calibration standards to obtain accurate results. The final SIMS data are then compared to those obtained using Si as the reference element, with those available from EMPA (B and F), and with the crystallographic constraints derived from SREF investigation. The results of this study can be extended to the measurement of light elements in complex silicate or non-silicate samples.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
