A fast and simple experimental method for the electrical characterisation (current voltage curve) of metal/semi-conductor interfaces is presented, discussed and experimentally tested. The sample preparation is reduced at minimum, no ohmic contacts are needed. The method can be used to characterize Schottky diodes and metallic contacts.
A fast experimental method to measure the current-voltage characteristics of metal/semiconductor interfaces
Centurioni E
2004
Abstract
A fast and simple experimental method for the electrical characterisation (current voltage curve) of metal/semi-conductor interfaces is presented, discussed and experimentally tested. The sample preparation is reduced at minimum, no ohmic contacts are needed. The method can be used to characterize Schottky diodes and metallic contacts.File in questo prodotto:
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