The purpose of this Study is the assessment of the properties of the conductance of silicon nanostructures. The calculation method, taken from the recent chemical literature, is based oil the scattering approach and on the extended Huckel theory and is further simplified by the parametrization of the contact potentials in terms of the Hamiltonian of the active region. The structures considered are crystalline columnar grains sandwiched between two adsorbing contacts and their size reaches 400 atoms. The calculations analyse the structural parameters and the electronic configuration of the grains and examine the relationship between this quantity and the conductance. It is shown that the conductance depends oil the energy difference across the occupied energy levels and for this reason has the same dependence oil the grain size and shape as the binding energy. This allows an unified formulation of the electronic and transport properties.

The scattering approach: Application to the conductance of silicon nanograins

Mazzone AM;Morandi V
2006

Abstract

The purpose of this Study is the assessment of the properties of the conductance of silicon nanostructures. The calculation method, taken from the recent chemical literature, is based oil the scattering approach and on the extended Huckel theory and is further simplified by the parametrization of the contact potentials in terms of the Hamiltonian of the active region. The structures considered are crystalline columnar grains sandwiched between two adsorbing contacts and their size reaches 400 atoms. The calculations analyse the structural parameters and the electronic configuration of the grains and examine the relationship between this quantity and the conductance. It is shown that the conductance depends oil the energy difference across the occupied energy levels and for this reason has the same dependence oil the grain size and shape as the binding energy. This allows an unified formulation of the electronic and transport properties.
2006
Istituto per la Microelettronica e Microsistemi - IMM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/41821
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