The critical current diffraction pattern of annular Josephson tunnel junctions whose barrier is defined by two concentric ellipses is analytically computed in the short junction approximation. The particular symmetry properties of this two-dimensional geometrical configuration are discussed. It is shown that in case of two ellipses having the same aspect ratio, the well known results derived for the circular annular junctions apply unalterated to elliptic junctions.
Critical current diffraction pattern of elliptic annular Josephson tunnel junctions
Nappi;Monaco;
2015
Abstract
The critical current diffraction pattern of annular Josephson tunnel junctions whose barrier is defined by two concentric ellipses is analytically computed in the short junction approximation. The particular symmetry properties of this two-dimensional geometrical configuration are discussed. It is shown that in case of two ellipses having the same aspect ratio, the well known results derived for the circular annular junctions apply unalterated to elliptic junctions.File in questo prodotto:
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