In this article, an innovative approach to microwave imaging, which combines a qualitative imaging technique and deep learning (DL), is presented. The goal is to develop a tool for reliable and user-independent retrieval of the shape of unknown targets from the knowledge of the scattered fields. Qualitative imaging methods are powerful inverse scattering tools, as they provide morphological information in real time. However, their outcome is a continuous map, which has to be hard-thresholded to clearly identify the targets. This thresholding unavoidably results in case-dependent, often user-biased, results. To deal with this issue, a DL approach, based on a physics-assisted deep neural network, is proposed to automatically classify image pixels, i.e., to generate binary masks, separating the targets (foreground) from the background. In particular, the proposed network binarizes the output of a qualitative imaging inversion technique known as the orthogonality sampling method. For the sake of comparison, a DL method is also exploited, which generates the binary masks directly from the scattered fields without any qualitative imaging aid. A quantitative assessment of the performances of both methods and a test on experimental data are provided.
A Physics-Assisted Deep Learning Microwave Imaging Framework for Real-Time Shape Reconstruction of Unknown Targets
Cavagnaro Marta;Crocco Lorenzo
2022
Abstract
In this article, an innovative approach to microwave imaging, which combines a qualitative imaging technique and deep learning (DL), is presented. The goal is to develop a tool for reliable and user-independent retrieval of the shape of unknown targets from the knowledge of the scattered fields. Qualitative imaging methods are powerful inverse scattering tools, as they provide morphological information in real time. However, their outcome is a continuous map, which has to be hard-thresholded to clearly identify the targets. This thresholding unavoidably results in case-dependent, often user-biased, results. To deal with this issue, a DL approach, based on a physics-assisted deep neural network, is proposed to automatically classify image pixels, i.e., to generate binary masks, separating the targets (foreground) from the background. In particular, the proposed network binarizes the output of a qualitative imaging inversion technique known as the orthogonality sampling method. For the sake of comparison, a DL method is also exploited, which generates the binary masks directly from the scattered fields without any qualitative imaging aid. A quantitative assessment of the performances of both methods and a test on experimental data are provided.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.