A methodology to characterize the complex dielectric permittivity of low-loss materials at millimeter and submillimeter wavelengths, based on whispering gallery mode dielectric resonators, is presented, together with some illustrative results.
Dielectric characterization by means of whispering gallery mode resonators
Strambini E;
2010
Abstract
A methodology to characterize the complex dielectric permittivity of low-loss materials at millimeter and submillimeter wavelengths, based on whispering gallery mode dielectric resonators, is presented, together with some illustrative results.File in questo prodotto:
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