Er3+ doped (100 - x)SiO2 - xZrO2 planar waveguides were prepared by the sol-gel route, with x ranging from 10 up to 30 mol%. Multilayer films doped with 0.3 mol% Er3+ ions were deposited on fused quartz substrates by the dip-coating technique. The thickness and refractive index were measured by m-line spectroscopy at different wavelengths. The fabrication protocol was optimized in order to confine one propagating mode at 1.5 ?m. Photoluminescence in the near and visible region indicated a crystalline local environment for the Er3+ ion.

Erbium-activated silica-zirconia planar waveguides prepared by sol-gel route

Alessandro Chiasera;Maurizio Ferrari;
2008

Abstract

Er3+ doped (100 - x)SiO2 - xZrO2 planar waveguides were prepared by the sol-gel route, with x ranging from 10 up to 30 mol%. Multilayer films doped with 0.3 mol% Er3+ ions were deposited on fused quartz substrates by the dip-coating technique. The thickness and refractive index were measured by m-line spectroscopy at different wavelengths. The fabrication protocol was optimized in order to confine one propagating mode at 1.5 ?m. Photoluminescence in the near and visible region indicated a crystalline local environment for the Er3+ ion.
2008
Istituto di fotonica e nanotecnologie - IFN
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/42196
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