Thin films of amorphous vanadium metal were deposited on a glass substrate using the electron beam evaporator, these thin films were thenexposed to a focused1064 nm wavelengthnanosecond laser pulses. The laser fluence was selected such that it was below the ablation threshold of the films, x-ray diffraction measurementrevealedthe formation of an oxide phase of vanadium after the laser exposure.The time of flight-secondary ion mass spectrometry data analysisshowed a uniform elemental distribution of the elements on the films, whereas the Rutherford backscattering spectrometry results showed that the concentration of oxygen as a function of the laser fluence wasincreasing, hinting to the incorporation of the oxygen atoms in the films as the laser fluenceincreases. UV-Vis-NIRpercentage reflectance measurements showed small evolution in the visible part of the spectrum due to laserexposure.

Metal and metal oxide transformation and texturing using pulsed fiber laser

Eaton;SM;Ramponi;Roberta;
2015

Abstract

Thin films of amorphous vanadium metal were deposited on a glass substrate using the electron beam evaporator, these thin films were thenexposed to a focused1064 nm wavelengthnanosecond laser pulses. The laser fluence was selected such that it was below the ablation threshold of the films, x-ray diffraction measurementrevealedthe formation of an oxide phase of vanadium after the laser exposure.The time of flight-secondary ion mass spectrometry data analysisshowed a uniform elemental distribution of the elements on the films, whereas the Rutherford backscattering spectrometry results showed that the concentration of oxygen as a function of the laser fluence wasincreasing, hinting to the incorporation of the oxygen atoms in the films as the laser fluenceincreases. UV-Vis-NIRpercentage reflectance measurements showed small evolution in the visible part of the spectrum due to laserexposure.
2015
Istituto di fotonica e nanotecnologie - IFN
laser
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/424413
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact