In this paper we present a de-embedding procedure in order to determine the equivalent circuit parameters of CNTFETs for RF applications. This proposed technique allows to remove random errors in measured S parameters of small-signal device: in this way the intrinsic model of CNTFETs can be implement directly in simulation software.
A de-embedding procedure to determine the equivalent circuit parameters of RF CNTFETs
Marani R;
2016
Abstract
In this paper we present a de-embedding procedure in order to determine the equivalent circuit parameters of CNTFETs for RF applications. This proposed technique allows to remove random errors in measured S parameters of small-signal device: in this way the intrinsic model of CNTFETs can be implement directly in simulation software.File in questo prodotto:
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