Comparative study of AuGeNi, Pt, Nd and Gd contacts on semi-insulating (SI) GaAs with respect to the backside quasi-ohmic AuGeNi contact in symmetrical geometry is investigated. Fabricated diode structures are characterized by the current- and capacitance-voltage dependencies. Each of contacts gives an original set of characteristics and current lower that corresponding to the ohmic, bulk limited transport in the initial, low bias (<0.02 V) region. Observed increase of UV photosensitivity in the structure with Gd contact is explained by the formation of a heterojunction Au/Gd2O3/SI-GaAs.

Role of contacts in metal/semi-insulating GaAs/metal structures: Symmetrical geometry

Gombia E;
2019

Abstract

Comparative study of AuGeNi, Pt, Nd and Gd contacts on semi-insulating (SI) GaAs with respect to the backside quasi-ohmic AuGeNi contact in symmetrical geometry is investigated. Fabricated diode structures are characterized by the current- and capacitance-voltage dependencies. Each of contacts gives an original set of characteristics and current lower that corresponding to the ohmic, bulk limited transport in the initial, low bias (<0.02 V) region. Observed increase of UV photosensitivity in the structure with Gd contact is explained by the formation of a heterojunction Au/Gd2O3/SI-GaAs.
2019
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
978-0-7354-1873-8
SEMIINSULATING GAAS; RADIATION; METALLIZATION; PERFORMANCE; PARAMETERS; BULK
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/426523
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