Secondary ion mass spectrometric characterization of Cd-free and Cd-containing brazing alloys for jewelry are presented, analyzing the surface composition and elemental distribution along the thickness both for master alloys and brazed joints. It was verified that the brazing process induced little modification in In-containing alloys. On the other hand, Cd evaporation from the alloy was verified after heating, confirming its danger to health under these conditions. The presence of intermetallic dusters was detected, indicating interactions between brazing alloys and 18 carat gold.

Role of secondary ion mass spectrometric analysis in the brazing of precious alloys

Piccirillo C;Fabrizio M;
1997

Abstract

Secondary ion mass spectrometric characterization of Cd-free and Cd-containing brazing alloys for jewelry are presented, analyzing the surface composition and elemental distribution along the thickness both for master alloys and brazed joints. It was verified that the brazing process induced little modification in In-containing alloys. On the other hand, Cd evaporation from the alloy was verified after heating, confirming its danger to health under these conditions. The presence of intermetallic dusters was detected, indicating interactions between brazing alloys and 18 carat gold.
1997
Inglese
11
12
1309
1314
http://www.scopus.com/record/display.url?eid=2-s2.0-0030847264&origin=inward
Secondary Ion Mass Spectrometry
Precious alloys
2
info:eu-repo/semantics/article
262
Piccirillo, C.; Fabrizio, M.; Daolio, S.; Facchin, B.
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/426834
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